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Overview
New technologies — wide-bandgap power devices, advanced packages, automotive-grade sensors — bring new failure mechanisms that existing methods don't always capture. Our research and development work helps clients and partners understand those mechanisms and build the methods to test for them.
Focus areas
Process development
Developing and optimising assembly and test processes for yield and reliability.
Reliability studies
Investigations of failure mechanisms, acceleration factors and lifetime models for new technologies.
New test-method development
Designing and validating test methods where standard procedures fall short.
AI-based semiconductor analytics
Machine-learning models on test and inspection data to predict failures, detect outliers and accelerate root-cause analysis.
Ways to collaborate
- Sponsored studies on specific devices, materials or mechanisms
- Joint development of test methods and qualification approaches
- Analytics projects using your existing test and yield data
- Collaboration with academic and industry research partners
Who it's for
Technology developers, semiconductor companies and research institutions that want an experienced, independent partner for reliability-focused R&D.