KAPSA SemiconSemiconductor Testing Lab
Electrical, parametric and functional testing at wafer and package level.
- Wafer & package test
- Parametric characterisation
- Production test
Laboratories
Nine laboratory disciplines. One integrated workflow.
Our laboratories are organised so a device can move seamlessly from electrical test to stress testing to failure analysis — without leaving our hands or losing its history.
Our disciplines
Specialist labs, connected by one quality system
Each laboratory discipline is run by specialists and operates under a common quality management system designed around ISO/IEC 17025.
Reliability Lab
Accelerated life and stress testing for qualification programmes.
- HTOL & life testing
- THB & HAST
- JEDEC / AEC-Q100 programmes
Failure Analysis Lab
Non-destructive and destructive analysis to identify root cause.
- X-ray & acoustic microscopy
- Decapsulation & cross-section
- SEM & FIB
Environmental Test Lab
Climatic and mechanical stress to simulate real-world conditions.
- Thermal cycling & shock
- Temperature & humidity
- Vibration & mechanical shock
Burn-in Lab
Elevated temperature and bias screening to remove early-life failures.
- Static & dynamic burn-in
- Lot screening
- Life-test support
EMC / EMI Lab
Electromagnetic emissions and immunity testing for electronic products.
- Radiated & conducted emissions
- ESD, EFT & surge immunity
- Pre-compliance testing
Materials Characterization Lab
Elemental, structural and chemical analysis of materials.
- SEM-EDS
- XRD & XRF
- FTIR & optical microscopy
Metrology Lab
Precise dimensional and physical measurement.
- Dimensional inspection
- Surface & thickness measurement
- Measurement uncertainty analysis
Calibration Lab
Traceable calibration of instruments and test equipment.
- Electrical calibration
- Thermal calibration
- Equipment verification
Integrated workflow
One sample journey, full traceability
Because our labs work as one, a device that fails a reliability test goes straight to failure analysis — with its full electrical and stress history attached.
- Unique sample IDs and chain-of-custody from receipt to report
- Controlled environments and calibrated equipment
- Confidential handling of client devices and data
Accreditation
Working to recognised frameworks
Our quality system is designed around ISO/IEC 17025, and we are pursuing NABL accreditation discipline by discipline — starting with reliability and failure analysis — to support recognition against frameworks such as JEDEC and AEC-Q100.
ISO/IEC 17025Laboratory competence
NABLNational accreditation body, India
JEDECSemiconductor reliability standards
AECAutomotive Electronics Council
MIL-STDMilitary test methods
IECInternational electrotechnical standards
Have a device, board or failure to investigate?
Share your requirement and our engineers will come back with a test plan, timeline and quotation — usually within one business day.